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SEMTech Solutions, Inc. announces the opening of its new metrology lab dedicated to surface roughness analysis. Using the Elionix 8900FE system, the lab will detect surface roughness deviations from 1 nm to several hundred microns as well as offering standard SEM features. It will be available for demonstrations and for the analysis of customer samples. For the press release, click here (117 KB pdf).  |
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Duke purchases first Elionix 50 kV EBL System |
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SEMTech Solutions, Inc. has announced that it will deliver the first Elionix 50 kV Electron Beam Lithography (EBL) System to Duke University in October 2007. It will be in operation at Duke's Shared Materials Instrumentation Facility (SMIF). Although this is the first system in the United States, over 30 have been installed across Asia in the last three years. For the press release, click here (98 KB pdf).  |
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New to North America, but not new! |
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As shown in the picture above, Optima Managing Director Ryoichi Shiozama, Elionix President Seigo Honme, and STS President Gerald O'Loughlin agree to work as a team to bring North America the very successful electron beam products manufactured by Elionix. |
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