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Using multiple detectors and proprietary technology, the electron beam surface roughness analyzers are capable of getting combined information similar to your SEM and AFM, but much quicker and easier.
ERA-8900FE Features: - A newly-developed TFE electron gun with high performance at low acceleration voltages. The resolution is high not only in X and Y direction as conventional SEMs but also in Z direction, realizing the real-time 3D display of the SEM view.
- Employing four channel secondary-electron detectors, three types of images, namely, Topographic image, Compositional image, and conventional SEM image, are available in high resolutions. The shadowless image at low magnifications, images of fine topographic details, and images of the gradual waviness, all of which have been impossible by conventional SEMs, are all available with the ERA-8800FE.
- Equipped with various automatic functions, the ERA-8900FE operation is extremely user-friendly.
e-RAM 8900FE Poster (558 KB pdf) e-RAM 8900FE Specs (2.27 MB pdf) As advertised in Microscopy Today (427 KB pdf) Images
EXAMPLES:Nano Indention Ceramic Surface HOVER OVER THIS IMAGE TO SEE CONVENTIONAL IMAGE |
