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New 3-D Metrology Lab

New 3-D Metrology Lab

SEMTech Solutions, Inc. announces the opening of its new metrology lab dedicated to surface roughness analysis. Using the Elionix 8900FE system, the lab will detect surface roughness deviations from 1 nm to several hundred microns as well as offering standard SEM features. It will be available for demonstrations and for the analysis of customer samples. For the press release, click here (117 KB pdf).

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