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You are here: Home News Annoucements New 3-D Metrology Lab

New 3-D Metrology Lab

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Category: Annoucements
Published on Monday, 04 June 2007 13:11
Written by Administrator

SEMTech Solutions, Inc. announces the opening of its new metrology lab dedicated to surface roughness analysis.  Using the Elionix 8900FE system, the lab will detect surface roughness deviations from 1 nm to several hundred microns as well as offering standard SEM features.  It will be available for demonstrations and for the analysis of customer samples.  For the press release, click here (117 KB pdf).

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